In:
Structural Dynamics, AIP Publishing, Vol. 7, No. 3 ( 2020-05-01)
Abstract:
We have recorded the diffraction patterns from individual xenon clusters irradiated with intense extreme ultraviolet pulses to investigate the influence of light-induced electronic changes on the scattering response. The clusters were irradiated with short wavelength pulses in the wavelength regime of different 4d inner-shell resonances of neutral and ionic xenon, resulting in distinctly different optical properties from areas in the clusters with lower or higher charge states. The data show the emergence of a transient structure with a spatial extension of tens of nanometers within the otherwise homogeneous sample. Simulations indicate that ionization and nanoplasma formation result in a light-induced outer shell in the cluster with a strongly altered refractive index. The presented resonant scattering approach enables imaging of ultrafast electron dynamics on their natural timescale.
Type of Medium:
Online Resource
ISSN:
2329-7778
Language:
English
Publisher:
AIP Publishing
Publication Date:
2020
detail.hit.zdb_id:
2758684-4
