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    Online-Ressource
    Online-Ressource
    IOP Publishing ; 2021
    In:  Surface Topography: Metrology and Properties Vol. 9, No. 1 ( 2021-03-01), p. 015014-
    In: Surface Topography: Metrology and Properties, IOP Publishing, Vol. 9, No. 1 ( 2021-03-01), p. 015014-
    Kurzfassung: The (002) oriented GaN nanostructured films prepared by pulsed laser deposition (PLD) on n-type Si (100) substrates were treated by H- and O-plasma, finding both treatments do not make the sizable changes in crystalline structure and morphology of GaN nanofilms. However, the field emission (FE) performance of GaN nanofilms is considerably improved by H-plasma treatment (H-GaN) but deteriorated by O-plasma treatment (O-GaN). The turn-on fields, E on , for H- and O-plasma treated GaN nanofilms are determined to be 0.52 and 1.79 V μ m −1 , respectively, in contrast with that of pristine GaN nanofilms, 0.95 V μ m −1 . The improvement of FE performance by the H-plasma treatments could be attributed to the reasons of the reduced surface potential barrier, the increased electron concentration, the increased surface conductivity, and the increased effective emission area. The first-principles calculations represents that the experimental and theoretical work function results have the same trend with the descending sequence of O-plasma treated GaN  〉  pristine GaN  〉  the H-plasma treated GaN.
    Materialart: Online-Ressource
    ISSN: 2051-672X
    Sprache: Unbekannt
    Verlag: IOP Publishing
    Publikationsdatum: 2021
    ZDB Id: 2739097-4
    Bibliothek Standort Signatur Band/Heft/Jahr Verfügbarkeit
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