In:
Journal of Applied Crystallography, International Union of Crystallography (IUCr), Vol. 43, No. 2 ( 2010-04-01), p. 297-307
Abstract:
Pair distribution function (PDF) methods have great potential for the study of diverse high-pressure phenomena. However, the measurement of high-quality, high-resolution X-ray PDF data (to Q max 〉 20 Å −1 ) remains a technical challenge. An optimized approach to measuring high-pressure total scattering data for samples contained within a diamond anvil cell (DAC) is presented here. This method takes into account the coupled influences of instrument parameters (photon energy, detector type and positioning, beam size/shape, focusing), pressure-cell parameters (target pressure range, DAC type, diamonds, pressure-transmitting media, backing plates, pressure calibration) and data reduction on the resulting PDF. The efficacy of our approach is demonstrated by the high-quality, high-pressure PDFs obtained for representative materials spanning strongly and weakly scattering systems, and crystalline and amorphous samples. These are the highest-resolution high-pressure PDFs reported to date and include those for α-alumina (to Q max = 20 Å −1 ), BaTiO 3 (to Q max = 30 Å −1 ) and pressure-amorphized zeolite (to Q max = 20 Å −1 ).
Type of Medium:
Online Resource
ISSN:
0021-8898
DOI:
10.1107/S0021889810002050
Language:
Unknown
Publisher:
International Union of Crystallography (IUCr)
Publication Date:
2010
detail.hit.zdb_id:
2020879-0
