In:
Journal of Synchrotron Radiation, International Union of Crystallography (IUCr), Vol. 23, No. 3 ( 2016-05-01), p. 658-664
Kurzfassung:
Hard X-ray Fabry–Perot resonators (FPRs) made from sapphire crystals were constructed and characterized. The FPRs consisted of two crystal plates, part of a monolithic crystal structure of Al 2 O 3 , acting as a pair of mirrors, for the backward reflection (0 0 0 30) of hard X-rays at 14.3147 keV. The dimensional accuracy during manufacturing and the defect density in the crystal in relation to the resonance efficiency of sapphire FPRs were analyzed from a theoretical standpoint based on X-ray cavity resonance and measurements using scanning electron microscopic and X-ray topographic techniques for crystal defects. Well defined resonance spectra of sapphire FPRs were successfully obtained, and were comparable with the theoretical predictions.
Materialart:
Online-Ressource
ISSN:
1600-5775
DOI:
10.1107/S1600577516004999
Sprache:
Unbekannt
Verlag:
International Union of Crystallography (IUCr)
Publikationsdatum:
2016
ZDB Id:
2021413-3