In:
Journal of Synchrotron Radiation, International Union of Crystallography (IUCr), Vol. 23, No. 5 ( 2016-09-01), p. 1151-1157
Kurzfassung:
Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.
Materialart:
Online-Ressource
ISSN:
1600-5775
DOI:
10.1107/S1600577516011917
DOI:
10.1107/S1600577516011917/gb5033sup1.pdf
Sprache:
Unbekannt
Verlag:
International Union of Crystallography (IUCr)
Publikationsdatum:
2016
ZDB Id:
2021413-3
