In:
Journal of Synchrotron Radiation, International Union of Crystallography (IUCr), Vol. 28, No. 6 ( 2021-11-01), p. 1845-1849
Abstract:
Oxygen K -edge X-ray absorption spectroscopy is used routinely to study a range of solid materials. However, liquid samples are studied less frequently at the oxygen K -edge due to the combined challenges of high-vacuum conditions and oxygen contamination of window materials. A modular sample holder design with a twist-seal sample containment system that provides a simple method to encapsulate liquid samples under high-vacuum conditions is presented. This work shows that pure silicon nitride windows have lower oxygen contamination than both diamond- and silicon-rich nitride windows, that the levels of oxygen contamination are related to the age of the windows, and provides a protocol for minimizing the background oxygen contamination. Acid-washed 100 nm-thick silicon nitride windows were found to give good quality oxygen K -edge data on dilute liquid samples.
Type of Medium:
Online Resource
ISSN:
1600-5775
DOI:
10.1107/S1600577521009942
Language:
Unknown
Publisher:
International Union of Crystallography (IUCr)
Publication Date:
2021
detail.hit.zdb_id:
2021413-3
