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Donggun Park ; Ya-chin King ; Qiang Lu ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 1998

In: IEEE Electron Device Letters Vol. 19, No. 11 ( 1998-11), p. 441-443

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 19, No. 11 ( 1998-11), p. 441-443

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/55.728906

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 1998

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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