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Li, Jianxing ; Shi, Junwei ; Li, Lumei ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2018

In: IEEE Access Vol. 6 ( 2018), p. 64063-64070

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In: IEEE Access, Institute of Electrical and Electronics Engineers (IEEE), Vol. 6 ( 2018), p. 64063-64070

Type of Medium: Online Resource

ISSN: 2169-3536

URL: Article

DOI: 10.1109/ACCESS.2018.2877425

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2018

detail.hit.zdb_id: 2687964-5

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