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Park, Huiung ; Kim, Haeyong ; Kim, Kyeong Tae ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2019

In: IEEE Access Vol. 7 ( 2019), p. 2200-2209

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In: IEEE Access, Institute of Electrical and Electronics Engineers (IEEE), Vol. 7 ( 2019), p. 2200-2209

Type of Medium: Online Resource

ISSN: 2169-3536

URL: Article

DOI: 10.1109/ACCESS.2018.2886375

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2019

detail.hit.zdb_id: 2687964-5

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