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Park, So-Hyun ; Yun, Sun-Woo ; Jeon, So-Eun ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2022

In: IEEE Access Vol. 10 ( 2022), p. 20259-20269

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In: IEEE Access, Institute of Electrical and Electronics Engineers (IEEE), Vol. 10 ( 2022), p. 20259-20269

Type of Medium: Online Resource

ISSN: 2169-3536

URL: Article

DOI: 10.1109/ACCESS.2022.3152574

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2022

detail.hit.zdb_id: 2687964-5

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