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Shih, Chi-Huang ; Lin, Pei-Jung ; Chen, Yen-Lin ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2024

In: IEEE Access Vol. 12 ( 2024), p. 61418-61432

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In: IEEE Access, Institute of Electrical and Electronics Engineers (IEEE), Vol. 12 ( 2024), p. 61418-61432

Type of Medium: Online Resource

ISSN: 2169-3536

URL: Article

DOI: 10.1109/ACCESS.2024.3392513

DOI: 10.1109/ACCESS.2024.3392513/mm1

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2024

detail.hit.zdb_id: 2687964-5

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