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Lim, Suhwan ; Kwon, Dongseok ; Eum, Jai-Ho ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2019

In: IEEE Journal of the Electron Devices Society Vol. 7 ( 2019), p. 522-528

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In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE), Vol. 7 ( 2019), p. 522-528

Type of Medium: Online Resource

ISSN: 2168-6734

URL: Journal

URL: Article

DOI: 10.1109/JEDS.6245494

DOI: 10.1109/JEDS.2019.2913146

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2019

detail.hit.zdb_id: 2696552-5

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