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Oh, Chae-Eun ; Han, Ye-Lim ; Lee, Dong-Ho ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2024

In: IEEE Journal of the Electron Devices Society Vol. 12 ( 2024), p. 564-568

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In: IEEE Journal of the Electron Devices Society, Institute of Electrical and Electronics Engineers (IEEE), Vol. 12 ( 2024), p. 564-568

Type of Medium: Online Resource

ISSN: 2168-6734

URL: Article

DOI: 10.1109/JEDS.2024.3434613

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2024

detail.hit.zdb_id: 2696552-5

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