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Kim, Kyu-hyoun ; Chung, Hoe-Ju ; Kim, Woo-Seop ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2007

In: IEEE Journal of Solid-State Circuits Vol. 42, No. 1 ( 2007-01), p. 193-200

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 42, No. 1 ( 2007-01), p. 193-200

Type of Medium: Online Resource

ISSN: 0018-9200

URL: Article

DOI: 10.1109/JSSC.2006.888297

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2007

detail.hit.zdb_id: 240580-5

detail.hit.zdb_id: 2040287-9

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