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Ohbayashi, Shigeki ; Yabuuchi, Makoto ; Nii, Koji ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2007

In: IEEE Journal of Solid-State Circuits Vol. 42, No. 4 ( 2007-04), p. 820-829

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 42, No. 4 ( 2007-04), p. 820-829

Type of Medium: Online Resource

ISSN: 0018-9200

URL: Article

DOI: 10.1109/JSSC.2007.891648

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2007

detail.hit.zdb_id: 240580-5

detail.hit.zdb_id: 2040287-9

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