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Peng, Shen-Yu ; Huang, Tzu-Chi ; Lee, Yu-Huei ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2013

In: IEEE Journal of Solid-State Circuits Vol. 48, No. 11 ( 2013-11), p. 2649-2661

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 48, No. 11 ( 2013-11), p. 2649-2661

Type of Medium: Online Resource

ISSN: 0018-9200 , 1558-173X

URL: Article

DOI: 10.1109/JSSC.2013.2274885

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2013

detail.hit.zdb_id: 240580-5

detail.hit.zdb_id: 2040287-9

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