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Satpathy, Sudhir ; Mathew, Sanu K. ; Suresh, Vikram ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2017

In: IEEE Journal of Solid-State Circuits Vol. 52, No. 4 ( 2017-4), p. 940-949

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 52, No. 4 ( 2017-4), p. 940-949

Type of Medium: Online Resource

ISSN: 0018-9200 , 1558-173X

URL: Article

DOI: 10.1109/JSSC.2016.2636859

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2017

detail.hit.zdb_id: 240580-5

detail.hit.zdb_id: 2040287-9

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