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Kim, Young-Ju ; Kwon, Hye-Jung ; Doo, Su-Yeon ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2019

In: IEEE Journal of Solid-State Circuits Vol. 54, No. 1 ( 2019-1), p. 197-209

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 54, No. 1 ( 2019-1), p. 197-209

Type of Medium: Online Resource

ISSN: 0018-9200 , 1558-173X

URL: Article

DOI: 10.1109/JSSC.2018.2883395

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2019

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detail.hit.zdb_id: 2040287-9

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