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Kao, Yu-Yung ; Hung, Sheng-Hsi ; Chen, Hsuan-Yu ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Journal of Solid-State Circuits Vol. 56, No. 12 ( 2021-12), p. 3619-3627

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 56, No. 12 ( 2021-12), p. 3619-3627

Type of Medium: Online Resource

ISSN: 0018-9200 , 1558-173X

URL: Article

DOI: 10.1109/JSSC.2021.3103875

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

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detail.hit.zdb_id: 2040287-9

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