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Chen, Bo-Hao ; Wu, Tzu-Ying ; Zheng, Kuo-Lin ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2023

In: IEEE Journal of Solid-State Circuits Vol. 58, No. 2 ( 2023-2), p. 486-496

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In: IEEE Journal of Solid-State Circuits, Institute of Electrical and Electronics Engineers (IEEE), Vol. 58, No. 2 ( 2023-2), p. 486-496

Type of Medium: Online Resource

ISSN: 0018-9200 , 1558-173X

URL: Article

DOI: 10.1109/JSSC.2022.3185158

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2023

detail.hit.zdb_id: 240580-5

detail.hit.zdb_id: 2040287-9

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