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Chung, J.W. ; Saadat, O.I. ; Tirado, J.M. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2009

In: IEEE Electron Device Letters Vol. 30, No. 9 ( 2009-09), p. 904-906

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 30, No. 9 ( 2009-09), p. 904-906

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/LED.2009.2026718

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2009

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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