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Lee, Yao-Jen ; Hsueh, Fu-Kuo ; Current, Michael I. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2012

In: IEEE Electron Device Letters Vol. 33, No. 2 ( 2012-2), p. 248-250

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 33, No. 2 ( 2012-2), p. 248-250

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/LED.2011.2176100

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2012

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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