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Tang, Zhikai ; Jiang, Qimeng ; Lu, Yunyou ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2013

In: IEEE Electron Device Letters Vol. 34, No. 11 ( 2013-11), p. 1373-1375

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 34, No. 11 ( 2013-11), p. 1373-1375

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/LED.2013.2279846

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2013

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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