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Wei Zhang ; Ying Hu ; Ting-Chang Chang ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2015

In: IEEE Electron Device Letters Vol. 36, No. 8 ( 2015-8), p. 772-774

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 36, No. 8 ( 2015-8), p. 772-774

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/LED.2015.2448756

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2015

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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