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Yeh, Chien-Hung ; Chang, Ting-Chang ; Kuo, Ting-Tzu ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2023

In: IEEE Electron Device Letters Vol. 44, No. 6 ( 2023-6), p. 971-974

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In: IEEE Electron Device Letters, Institute of Electrical and Electronics Engineers (IEEE), Vol. 44, No. 6 ( 2023-6), p. 971-974

Type of Medium: Online Resource

ISSN: 0741-3106 , 1558-0563

URL: Article

DOI: 10.1109/LED.2023.3268220

RVK:

ZG 1100

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2023

detail.hit.zdb_id: 245158-X

detail.hit.zdb_id: 2034325-5

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