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A Capacitively Coupled CT Δ ΣM With Chopping Artifacts Rejection for Sensor Readout ICs

Lim, Chaegang ; Choi, Yohan ; Park, Yunsoo ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Transactions on Circuits and Systems I: Regular Papers Vol. 68, No. 8 ( 2021-8), p. 3242-3253

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In: IEEE Transactions on Circuits and Systems I: Regular Papers, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 8 ( 2021-8), p. 3242-3253

Type of Medium: Online Resource

ISSN: 1549-8328 , 1558-0806

URL: Article

DOI: 10.1109/TCSI.2021.3084350

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

detail.hit.zdb_id: 2028230-8

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Kooperativer Bibliotheksverbund

Berlin Brandenburg