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Du, Jie ; Vong, Chi-Man ; Chen, C. L. Philip

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Transactions on Cybernetics Vol. 51, No. 3 ( 2021-3), p. 1586-1597

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In: IEEE Transactions on Cybernetics, Institute of Electrical and Electronics Engineers (IEEE), Vol. 51, No. 3 ( 2021-3), p. 1586-1597

Type of Medium: Online Resource

ISSN: 2168-2267 , 2168-2275

URL: Journal

URL: Article

DOI: 10.1109/TCYB.6221036

DOI: 10.1109/TCYB.2020.2969705

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

detail.hit.zdb_id: 2696559-8

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