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Partial discharge occurrence induced by crack defect on GIS insulator operated at 1100 kV

Ji, Hong-xin ; Li, Cheng-rong ; Ma, Guo-ming ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2016

In: IEEE Transactions on Dielectrics and Electrical Insulation Vol. 23, No. 4 ( 2016-8), p. 2250-2257

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In: IEEE Transactions on Dielectrics and Electrical Insulation, Institute of Electrical and Electronics Engineers (IEEE), Vol. 23, No. 4 ( 2016-8), p. 2250-2257

Type of Medium: Online Resource

ISSN: 1070-9878

URL: Article

DOI: 10.1109/TDEI.2016.7556501

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2016

detail.hit.zdb_id: 2035702-3

detail.hit.zdb_id: 3138119-4

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Kooperativer Bibliotheksverbund

Berlin Brandenburg