In:
IEEE Transactions on Device and Materials Reliability, Institute of Electrical and Electronics Engineers (IEEE), Vol. 14, No. 1 ( 2014-03), p. 358-364
Materialart:
Online-Ressource
ISSN:
1530-4388
,
1558-2574
DOI:
10.1109/TDMR.2012.2204752
Sprache:
Unbekannt
Verlag:
Institute of Electrical and Electronics Engineers (IEEE)
Publikationsdatum:
2014
ZDB Id:
2061445-7