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Ryu, Seong-Wan ; Han, Jin-Woo ; Kim, Chung-Jin ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2009

In: IEEE Transactions on Electron Devices Vol. 56, No. 4 ( 2009-04), p. 601-608

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 56, No. 4 ( 2009-04), p. 601-608

Type of Medium: Online Resource

ISSN: 0018-9383

URL: Article

DOI: 10.1109/TED.2008.2012292

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2009

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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