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Lin, Jyi-Tsong ; Eng, Yi-Chuen ; Huang, Hau-Yuan ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2008

In: IEEE Transactions on Electron Devices Vol. 55, No. 6 ( 2008-06), p. 1480-1486

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 55, No. 6 ( 2008-06), p. 1480-1486

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2008.922490

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2008

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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