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Patrashin, Mikhail ; Sekine, Norihiko ; Kasamatsu, Akifumi ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2015

In: IEEE Transactions on Electron Devices Vol. 62, No. 3 ( 2015-3), p. 1068-1071

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 62, No. 3 ( 2015-3), p. 1068-1071

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2015.2393358

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2015

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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