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Zhao, Cheng-Yu ; Li, Jun ; Zhong, De-Yao ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2018

In: IEEE Transactions on Electron Devices Vol. 65, No. 2 ( 2018-2), p. 526-532

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 65, No. 2 ( 2018-2), p. 526-532

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Journal

URL: Article

DOI: 10.1109/TED.16

DOI: 10.1109/TED.2017.2781725

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2018

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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