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Li, Jun ; Zhong, De-Yao ; Huang, Chuan-Xin ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2018

In: IEEE Transactions on Electron Devices Vol. 65, No. 7 ( 2018-7), p. 2838-2843

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 65, No. 7 ( 2018-7), p. 2838-2843

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2018.2834506

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2018

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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