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Chien, Wei-Chih ; Yeh, Chiao-Wen ; Bruce, Robert L. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2018

In: IEEE Transactions on Electron Devices Vol. 65, No. 11 ( 2018-11), p. 5172-5179

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 65, No. 11 ( 2018-11), p. 5172-5179

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2018.2871197

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2018

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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