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Kang, Xuanwu ; Sun, Yue ; Zheng, Yingkui ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Transactions on Electron Devices Vol. 68, No. 3 ( 2021-3), p. 1369-1373

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 3 ( 2021-3), p. 1369-1373

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Journal

URL: Article

DOI: 10.1109/TED.16

DOI: 10.1109/TED.2021.3050739

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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