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Yun, Kwang-Ro ; Lee, Hwa-Seub ; Kim, Jong-Ho ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Transactions on Electron Devices Vol. 68, No. 12 ( 2021-12), p. 6166-6170

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 12 ( 2021-12), p. 6166-6170

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2021.3120708

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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