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Yoo, Changhyun ; Chang, Jeesoo ; Seon, Yoongeun ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2022

In: IEEE Transactions on Electron Devices Vol. 69, No. 3 ( 2022-3), p. 1524-1531

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 69, No. 3 ( 2022-3), p. 1524-1531

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2022.3141327

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2022

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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