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Zhanghu, Mengyuan ; Liu, Zhaojun ; Liu, Yibo ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2024

In: IEEE Transactions on Electron Devices Vol. 71, No. 10 ( 2024-10), p. 6190-6197

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In: IEEE Transactions on Electron Devices, Institute of Electrical and Electronics Engineers (IEEE), Vol. 71, No. 10 ( 2024-10), p. 6190-6197

Type of Medium: Online Resource

ISSN: 0018-9383 , 1557-9646

URL: Article

DOI: 10.1109/TED.2024.3449829

DOI: 10.1109/TED.2024.3449829/mm1

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2024

detail.hit.zdb_id: 2028088-9

detail.hit.zdb_id: 241634-7

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