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Zheng, Lianqing ; Li, Sen ; Tan, Bin ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2023

In: IEEE Transactions on Instrumentation and Measurement Vol. 72 ( 2023), p. 1-14

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In: IEEE Transactions on Instrumentation and Measurement, Institute of Electrical and Electronics Engineers (IEEE), Vol. 72 ( 2023), p. 1-14

Type of Medium: Online Resource

ISSN: 0018-9456 , 1557-9662

URL: Article

DOI: 10.1109/TIM.2023.3280525

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2023

detail.hit.zdb_id: 160442-9

detail.hit.zdb_id: 2027532-8

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