In:
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 32, No. 1 ( 1985-2), p. 605-608
Materialart:
Online-Ressource
ISSN:
0018-9499
,
1558-1578
DOI:
10.1109/TNS.1985.4336905
Sprache:
Unbekannt
Verlag:
Institute of Electrical and Electronics Engineers (IEEE)
Publikationsdatum:
1985
ZDB Id:
218510-6
ZDB Id:
2025398-9