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King, M. ; Guido Boening ; Baker, S. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2004

In: IEEE Transactions on Nuclear Science Vol. 51, No. 5 ( 2004-10), p. 2606-2611

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 51, No. 5 ( 2004-10), p. 2606-2611

Type of Medium: Online Resource

ISSN: 0018-9499

URL: Article

DOI: 10.1109/TNS.2004.835784

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2004

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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