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Zhou, X. J. ; Fleetwood, D. M. ; Tsetseris, L. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2006

In: IEEE Transactions on Nuclear Science Vol. 53, No. 6 ( 2006-12), p. 3636-3643

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 53, No. 6 ( 2006-12), p. 3636-3643

Type of Medium: Online Resource

ISSN: 0018-9499

URL: Article

DOI: 10.1109/TNS.2006.884249

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2006

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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