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Najafizadeh, Laleh ; Vo, Tuan ; Phillips, Stanley D. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2008

In: IEEE Transactions on Nuclear Science Vol. 55, No. 6 ( 2008-12), p. 3253-3258

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 55, No. 6 ( 2008-12), p. 3253-3258

Type of Medium: Online Resource

ISSN: 0018-9499

URL: Article

DOI: 10.1109/TNS.2008.2007120

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2008

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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