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Madan, Anuj ; Phillips, Stanley D. ; Cressler, John D. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2009

In: IEEE Transactions on Nuclear Science Vol. 56, No. 4 ( 2009-08), p. 1914-1919

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 56, No. 4 ( 2009-08), p. 1914-1919

Type of Medium: Online Resource

ISSN: 0018-9499

URL: Article

DOI: 10.1109/TNS.2009.2014064

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2009

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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