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Hauf, Steffen ; Kuster, Markus ; Batic, Matej ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2013

In: IEEE Transactions on Nuclear Science Vol. 60, No. 4 ( 2013-08), p. 2984-2997

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 60, No. 4 ( 2013-08), p. 2984-2997

Type of Medium: Online Resource

ISSN: 0018-9499 , 1558-1578

URL: Article

DOI: 10.1109/TNS.2013.2271047

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2013

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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