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Dodds, N. A. ; Schwank, J. R. ; Shaneyfelt, M. R. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2014

In: IEEE Transactions on Nuclear Science Vol. 61, No. 6 ( 2014-12), p. 2904-2914

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 61, No. 6 ( 2014-12), p. 2904-2914

Type of Medium: Online Resource

ISSN: 0018-9499 , 1558-1578

URL: Article

DOI: 10.1109/TNS.2014.2364953

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2014

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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