In:
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 66, No. 1 ( 2019-1), p. 389-396
Type of Medium:
Online Resource
ISSN:
0018-9499
,
1558-1578
DOI:
10.1109/TNS.2018.2886577
Language:
Unknown
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)
Publication Date:
2019
detail.hit.zdb_id:
218510-6
detail.hit.zdb_id:
2025398-9