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Becker, Daniel T. ; Alpert, Bradley K. ; Bennett, Douglas A. ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2019

In: IEEE Transactions on Nuclear Science Vol. 66, No. 12 ( 2019-12), p. 2355-2363

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 66, No. 12 ( 2019-12), p. 2355-2363

Type of Medium: Online Resource

ISSN: 0018-9499 , 1558-1578

URL: Journal

URL: Article

DOI: 10.1109/TNS.23

DOI: 10.1109/TNS.2019.2953650

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2019

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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