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Aharonian, F. ; An, Q. ; Axikegu ; [et al.]

Institute of Electrical and Electronics Engineers (IEEE) ; 2021

In: IEEE Transactions on Nuclear Science Vol. 68, No. 8 ( 2021-8), p. 2257-2267

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In: IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers (IEEE), Vol. 68, No. 8 ( 2021-8), p. 2257-2267

Type of Medium: Online Resource

ISSN: 0018-9499 , 1558-1578

URL: Article

DOI: 10.1109/TNS.2021.3092739

RVK:

UA 1000

Language: Unknown

Publisher: Institute of Electrical and Electronics Engineers (IEEE)

Publication Date: 2021

detail.hit.zdb_id: 218510-6

detail.hit.zdb_id: 2025398-9

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